X-ray and scanning cathodoluminescence imaging of small-angle grain boundaries and dislocations in CdTe crystals

By employing the Reflection X-ray Topography (RXT), on one hand, and the Cathodoluminescence (CL-IR) mode of operation of the Scanning Electron Microscope, on the other hand, we are able to visualize the lattice defects in CdTe single crystals. The possibility of defect identification is the advantage of the RXT technique. Moreover, the examined surface can be imaged as a whole. Cathodoluminescence, however, guarantees higher resolution. The defects in CdTe crystals, observed in cathodoluminescence images, have been identified as small-angle boundaries and screw dislocations. (author)