Published February 2, 2007 | Version v1
Journal article

A Variation of the F-Test for Determining Statistical Relevance of Particular Parameters in EXAFS Fits

  • 1. Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  • 2. Physics Department, University of California, Santa Cruz, California 95060 (United States)

Description

A general problem when fitting EXAFS data is determining whether particular parameters are statistically significant. The F-test is an excellent way of determining relevancy in EXAFS because it only relies on the ratio of the fit residual of two possible models, and therefore the data errors approximately cancel. Although this test is widely used in crystallography (there, it is often called a ''Hamilton test'') and has been properly applied to EXAFS data in the past, it is very rarely applied in EXAFS analysis. We have implemented a variation of the F-test adapted for EXAFS data analysis in the RSXAP analysis package, and demonstrate its applicability with a few examples, including determining whether a particular scattering shell is warranted, and differentiating between two possible species or two possible structures in a given shell

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
882
Journal Issue
1
Journal Page Range
p. 129-131
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
13. international conference on X-ray absorption fine structure
Acronym
XAFS13
Dates
9-14 Jul 2006
Place
Stanford, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39071572
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DATA ANALYSIS; ERRORS; FINE STRUCTURE; SCATTERING; TESTING; VARIATIONS; X-RAY SPECTROSCOPY
Descriptors DEC
SPECTROSCOPY

Optional Information

Notes
(c) 2007 American Institute of Physics