Effect of Fe-ion implantation doping on structural and optical properties of CdS thin films
- 1. Institute of Physics, Bhubaneswar (India)
- 2. Forschungszentrum Dresden-Rossendorf, Institute of Ion Beam Physics and Materials Research, Dresden (Germany)
- 3. Kongunadu Arts and Science College, Department of Physics, Coimbatore (India)
Description
We report on effects of Fe implantation doping-induced changes in structural, optical, morphological, and vibrational properties of cadmium sulfide thin films. Films were implanted with 90 keV Fe+ ions at room temperature for a wide range of fluences from 0.1 x 1016 to 3.6 x 1016 ions cm-2 (corresponding to 0.38-12.03 at.% of Fe). Glancing angle X-ray diffraction analysis revealed that the implanted Fe atoms tend to supersaturate by occupying the substitutional cationic sites rather than forming metallic clusters or secondary phase precipitates. In addition, Fe doping does not lead to any structural phase transformation although it induces structural disorder and lattice contraction. Optical absorption studies show a reduction in the optical band gap from 2.39 to 2.17 eV with increasing Fe concentration. This is attributed to disorder-induced band tailing in semiconductors and ion-beam-induced grain growth. The strain associated with a lattice contraction is deduced from micro-Raman scattering measurements and is found that size and shape fluctuations of grains, at higher fluences, give rise to inhomogeneity in strain. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-010-5598-zAdditional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 99
- Journal Issue
- 4
- Journal Page Range
- p. 837-842
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 41100392
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; ATOMIC FORCE MICROSCOPY; BAND THEORY; CADMIUM SULFIDES; DOPED MATERIALS; ELECTRONIC STRUCTURE; ENERGY GAP; ENERGY SPECTRA; FLUCTUATIONS; GRAIN SIZE; HEXAGONAL LATTICES; ION IMPLANTATION; IRON ADDITIONS; IRON IONS; KEV RANGE 10-100; LATTICE PARAMETERS; MORPHOLOGY; PHYSICAL RADIATION EFFECTS; RAMAN SPECTRA; SEMICONDUCTOR MATERIALS; STRAINS; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; VISIBLE SPECTRA; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CADMIUM COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ENERGY RANGE; FILMS; INORGANIC PHOSPHORS; IONS; IRON ALLOYS; KEV RANGE; MATERIALS; MICROSCOPY; MICROSTRUCTURE; PHOSPHORS; RADIATION EFFECTS; SCATTERING; SIZE; SPECTRA; SULFIDES; SULFUR COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; VARIATIONS