Vulnerability and Hardening Studies of Optical and Illumination Systems at MGy Dose Levels
- 1. Univ St Etienne, UMR CNRS 5516, Lab Hubert Curien, F-42000 St Etienne (France)
- 2. CEA, DAM, DIF, F-91297 Arpajon (France)
Description
In the framework of the fusion for energy radiation hard imaging system project, the main radiation effects affecting the image quality of a miniaturized complementary metal oxide semiconductor-based camera exposed to radiation doses up to MGy(SiO2) are investigated for ITER applications. The radiation effects related to two of the three subcomponents of the camera are investigated: the optical system (OS) and the illumination system (IS). Subsystem demonstrators have been manufactured selecting radiation tolerant or hardened materials and components to demonstrate the feasibility to withstand such high dose levels while fulfilling the ITER remote handling needs in terms of optical performances and miniaturization. Regarding the OS, the observed degradation of the radiation-hardened optical glasses used for the OS lenses is characterized in terms of both radiation-induced attenuation and radiation-induced refractive-index change. At the system level, impact of these phenomena on the OS demonstrator performances is discussed in terms of image contrast. Radiation test results highlight the high radiation tolerance of manufactured monochrome and color OS to both degradation mechanisms. Regarding the IS, the selected architecture consists in a ring of 20 commercially available light-emitting diodes (LEDs) with monochrome (amber) or white emissions. An appropriate choice for the LEDs allows designing an IS with the requested performances and slight degradation of its output power at the MGy dose levels. From the obtained results, developing miniaturized IS and OS subcomponents for MGy dose operation levels appears realistic using commercially available technologies and appropriate hardening procedures. (authors)
Availability note (English)
Available from doi: http://dx.doi.org/10.1109/tns.2017.2783187Additional details
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 65
- Journal Issue
- no.1
- Journal Page Range
- p. 132-140
- ISSN
- 0018-9499
INIS
- Country of Publication
- United States
- Country of Input or Organization
- France
- INIS RN
- 52112200
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- DESIGN; GLASS; ITER TOKAMAK; LIGHT EMITTING DIODES; LIGHTING SYSTEMS; MINIATURIZATION; OPTICAL SYSTEMS; PERFORMANCE; RADIATION DOSES; RADIATION EFFECTS; REFRACTIVE INDEX; REMOTE HANDLING; SEMICONDUCTOR MATERIALS; SILICA; SILICON OXIDES; VULNERABILITY
- Descriptors DEC
- CHALCOGENIDES; CLOSED PLASMA DEVICES; DOSES; ENERGY SYSTEMS; MATERIALS; MINERALS; OPTICAL PROPERTIES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SILICON COMPOUNDS; THERMONUCLEAR DEVICES; THERMONUCLEAR REACTORS; TOKAMAK DEVICES; TOKAMAK TYPE REACTORS