X-ray scattering studies of strongly correlated electron system
Creators
- 1. Tokyo Univ., Dept. of Advanced Materials Science, Kashiwa, Chiba (Japan)
Description
Valence electrons in strongly correlated electron systems are sometimes itinerant and sometimes localized. When they are localized, spatial modulations of charge, orbital, and spin degrees of freedom often arise. Synchrotron x-ray scattering measurements can provide information about the spatial arrangement of charges, orbitals and spin moments through scattering spectroscopies of core-electron excitations and precise analyses of spatial distribution of total electron density as well as atoms, and hence are regarded as a useful tool for studying the electronic states in strongly correlated electron systems. In future, spatial and temporal correlation of charge and magnetic moment may be measured as a function of not only reciprocal space and energy space but also real space and real time, which will open the door to the 'eight-dimensional measurements'. (author)
Additional details
Publishing Information
- Journal Title
- Hoshako
- Journal Volume
- 27
- Journal Issue
- 6
- Journal Page Range
- p. 290-297
- ISSN
- 0914-9287
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 46060370
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHARGE DENSITY; CRYSTAL STRUCTURE; ELECTRON CORRELATION; HARD X RADIATION; LANTHANUM COMPOUNDS; MAGNETIC CIRCULAR DICHROISM; MAGNETIC MOMENTS; NICKEL OXIDES; ORBITAL ANGULAR MOMENTUM; ORDER-DISORDER MODEL; SPIN; STRONTIUM COMPOUNDS; SYNCHROTRON RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ANGULAR MOMENTUM; BREMSSTRAHLUNG; CHALCOGENIDES; CORRELATIONS; DICHROISM; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATHEMATICAL MODELS; NICKEL COMPOUNDS; NUCLEAR MODELS; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; X RADIATION
Optional Information
- Notes
- 25 refs., 8 figs., 1 tab.