Published May 21, 2017
| Version v1
Journal article
Automatic attenuator upgrade for a Siemens D500 diffractometer via a generic software library to overcome hardware limitations
- 1. Technische Universität München, Physik-Department E21, James-Franck-Str. 1, 85748 Garching (Germany)
- 2. Georg-August-Universität Göttingen, Fakultät für Geowissenschaften und Geologie, Abteilung Isotopengeologie Außenstelle MLZ (FRM II), Lichtenbergstr. 1, 85748 Garching (Germany)
Description
A proxy software was developed which allows the Siemens D500 x-ray diffractometer to be upgraded with add-ons that have never been officially available for it. For demonstration, we designed and integrated an automatic attenuator option and demonstrated the feasibility of our upgrade path by typical comparative x-ray measurements, which would usually saturate the x-ray detector, if no attenuator is used.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2017.02.088Additional details
Identifiers
- DOI
- 10.1016/j.nima.2017.02.088;
- PII
- S0168-9002(17)30309-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 855
- Journal Page Range
- p. 61-64
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48085870
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATTENUATION; AUTOMATION; COMPARATIVE EVALUATIONS; COMPUTER CODES; COMPUTER-AIDED MANUFACTURING; NUCLEAR INDUSTRY; X RADIATION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; EVALUATION; INDUSTRY; IONIZING RADIATIONS; MANUFACTURING; MEASURING INSTRUMENTS; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.