Published November 1, 2012 | Version v1
Journal article

Quantitative determination of hydrogen absorption by Pd cluster-assembled films using a quartz crystal microbalance

  • 1. Laboratorio de Ciencia de Materiales, Facultad de Física, Pontificia Universidad Católica de Chile, Santiago (Chile)
  • 2. Laboratorium voor Vaste-Stoffysica en Magnetisme, KU Leuven, Celestijnenlaan 200D-bus 2414 B-3001 Leuven (Belgium)

Description

We have measured hydrogen absorption capacity for a series of Pd films grown by two deposition techniques: a) flat films made with e-beam evaporation of Pd and b) films made of assembled Pd clusters. The films range in thickness from 9.5 to 45 nm. The technique implemented for measuring the amount of hydrogen absorbed by the films was a quartz crystal microbalance. The Pd films were grown on the quartz crystals and the change of mass due to the hydrogen absorption was determined from the shifting of the resonance frequency. Minute amounts of hydrogen absorbed of the order of nanograms per square centimeter can be detected by this technique. Plots of H/Pd atom ratio for each Pd film as a function of hydrogen pressure were obtained. The Pd e-beam grown films displayed a saturation H/Pd atomic ratio around 0.6 which is similar to bulk Pd. The Pd cluster film with a thickness of 14 nm displayed a remarkable absorption capacity with a ratio H/(Pd) ≈0.84. - Highlights: ► Pd cluster assembled films with different thicknesses are made and characterized. ► Quartz crystal microbalance is used to quantification the hydrogen amount absorbed. ► Hydrogen absorption/adsorption by Pd film is explained. ► Absorption expressed in H/Pd mass ratio is given for all Pd films. ► This complements H2 absorption on metal cluster films using optical techniques.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2012.08.006

Additional details

Identifiers

DOI
10.1016/j.tsf.2012.08.006;
PII
S0040-6090(12)01019-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
522
Journal Page Range
p. 199-203
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Engineering of wide bandgap semiconductor materials for energy saving
Acronym
E-MRS 2011 Symposium Q
Dates
9-10 May 2011
Place
Nice (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44103703
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ADSORPTION; CRYSTALS; DEPOSITION; ELECTRON BEAMS; EVAPORATION; HYDROGEN; MICROBALANCES; PALLADIUM; QUARTZ; THICKNESS; THIN FILMS
Descriptors DEC
BALANCES; BEAMS; DIMENSIONS; ELEMENTS; FILMS; LEPTON BEAMS; MEASURING INSTRUMENTS; METALS; MINERALS; NONMETALS; OXIDE MINERALS; PARTICLE BEAMS; PHASE TRANSFORMATIONS; PLATINUM METALS; SORPTION; TRANSITION ELEMENTS; WEIGHT INDICATORS

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.