Published October 4, 2013 | Version v1
Journal article

Low-background X-ray detection with Micromegas for axion research

  • 1. Laboratorio de Física Nuclear y Altas Energías, Universidad de Zaragoza, Zaragoza (Spain)
  • 2. IRFU, Centre d'Études Nucléaires de Saclay (CEA-Saclay), Gif-sur-Yvette (France)
  • 3. Physics Department, University of Patras, Patras (Greece)
  • 4. European Organization for Nuclear Research (CERN), Genève (Switzerland)
  • 5. Dogus University, Istanbul (Turkey)

Description

We have studied low-background techniques in order to improve the background level for Micromegas detectors. These detectors are good candidates for rare event searches thanks to the low mass and the radiopurity of the materials used in the construction; moreover they have good discrimination capabilities. The motivation of these studies is the reduction of the background level in the CAST experiment where three of the four detectors operating currently are Micromegas of the microbulk type. The last result of the experience acquired in low-background techniques has been the reduction of the background level by a factor 4.5 for two detectors in the CAST experiment, corresponding to an improvement of a factor 2 in signal strength

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/460/1/012003

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
460
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1742-6596

Conference

Title
6. symposium on large TPCs for low energy rare event detection
Dates
17-19 Dec 2012
Place
Paris (France)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46002101
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BACKGROUND RADIATION; MULTIPARTICLE SPECTROMETERS; PARTICLE DISCRIMINATION; SEMICONDUCTOR DETECTORS; X-RAY DETECTION
Descriptors DEC
DETECTION; MEASURING INSTRUMENTS; PARTICLE IDENTIFICATION; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SPECTROMETERS