Published October 4, 2013
| Version v1
Journal article
Low-background X-ray detection with Micromegas for axion research
Creators
- 1. Laboratorio de Física Nuclear y Altas Energías, Universidad de Zaragoza, Zaragoza (Spain)
- 2. IRFU, Centre d'Études Nucléaires de Saclay (CEA-Saclay), Gif-sur-Yvette (France)
- 3. Physics Department, University of Patras, Patras (Greece)
- 4. European Organization for Nuclear Research (CERN), Genève (Switzerland)
- 5. Dogus University, Istanbul (Turkey)
Description
We have studied low-background techniques in order to improve the background level for Micromegas detectors. These detectors are good candidates for rare event searches thanks to the low mass and the radiopurity of the materials used in the construction; moreover they have good discrimination capabilities. The motivation of these studies is the reduction of the background level in the CAST experiment where three of the four detectors operating currently are Micromegas of the microbulk type. The last result of the experience acquired in low-background techniques has been the reduction of the background level by a factor 4.5 for two detectors in the CAST experiment, corresponding to an improvement of a factor 2 in signal strength
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/460/1/012003Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 460
- Journal Issue
- 1
- Journal Page Range
- [7 p.]
- ISSN
- 1742-6596
Conference
- Title
- 6. symposium on large TPCs for low energy rare event detection
- Dates
- 17-19 Dec 2012
- Place
- Paris (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46002101
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND RADIATION; MULTIPARTICLE SPECTROMETERS; PARTICLE DISCRIMINATION; SEMICONDUCTOR DETECTORS; X-RAY DETECTION
- Descriptors DEC
- DETECTION; MEASURING INSTRUMENTS; PARTICLE IDENTIFICATION; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SPECTROMETERS