A hierarchical architecture of PANI/APTES/SiC nano-composites with tunable dielectric for lightweight and strong microwave absorption
Creators
- 1. Shandong University, Key Laboratory for Liquid–Solid Structural Evolution and Processing of Materials (China)
- 2. Shandong University, Carbon Fiber Engineering Research Center, School of Material Science and Engineering (China)
- 3. Shandong University, School of Energy and Power Engineering (China)
Description
With the goal of lightweight and strong microwave absorption, polyaniline/aminopropyltriethoxysilane/silicon carbide (PANI/APTES/SiC) nano-composites with hierarchical architecture were fabricated through a facile in situ polymerization method. Herein, the SiC powders were modified with APTES in advance to achieve a more uniform envelope by PANI. The composites with different thicknesses of PANI layer and adjustable dielectric properties can be obtained by altering the PANI ratio. For the optimized sample, the minimum value of reflection loss is − 51.34 dB at 13.92 GHz with a thickness of 1.9 mm and the effective attenuation bandwidth is in a broad range from 12.19 to 17.45 GHz (bandwidth of 5.26 GHz). The outstanding absorption properties are closely related to the suitable impedance matching and the multiple loss mechanisms.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science
- Journal Volume
- 54
- Journal Issue
- 3
- Journal Page Range
- p. 2181-2192
- ISSN
- 0022-2461
- CODEN
- JMTSAS
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49104721
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ARCHITECTURE; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; GHZ RANGE; MICROWAVE RADIATION; SILICON CARBIDES
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; FREQUENCY RANGE; MATERIALS; PHYSICAL PROPERTIES; RADIATIONS; SILICON COMPOUNDS; SORPTION
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature
- Notes
- http://www.springer-ny.com