Published November 30, 2009 | Version v1
Journal article Metadata-only

Ion-induced self-organized ripple patterns on graphite and diamond surfaces

Creators

  • 1. Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585 (Japan)
  • 2. IMR, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan)
  • 3. Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan)
  • 4. Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195 (Japan)

Description

In order to investigate the allotropic effect on ripple pattern formation, highly oriented pyrolytic graphite (HOPG) and single crystalline diamond were irradiated with 10-200 keV Xe+ at an incident angle of 60 deg. with respective to the surface normal. The irradiation fluence was 2 x 1017 cm-2 for all irradiations. Ripple patterns were observed on both HOPG and diamond surfaces. However, large differences in ripple wavelengths, amplitudes and surface roughnesses between HOPG and diamond were recognized. The reason for these differences is discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2009.05.103

Additional details

Identifiers

DOI
10.1016/j.apsusc.2009.05.103;
PII
S0169-4332(09)00731-4;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
256
Journal Issue
4
Journal Page Range
p. 972-975
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
4. vacuum and surface sciences conference of Asia and Australia
Acronym
VASSCAA-4
Dates
28-31 Oct 2008
Place
Matsue (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44018299
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; DIAMONDS; EROSION; GRAPHITE; ION BEAMS; IRRADIATION; KEV RANGE; MONOCRYSTALS; ROUGHNESS; SPUTTERING; SURFACES; WAVELENGTHS; XENON IONS
Descriptors DEC
BEAMS; CARBON; CHARGED PARTICLES; CRYSTALS; ELEMENTS; ENERGY RANGE; IONS; MICROSCOPY; MINERALS; NONMETALS; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.