Published October 21, 2011 | Version v1
Journal article

Large defect-induced sub-bandgap photoresponse in semiconductor nanowires via waveguiding excitation

  • 1. State Key Laboratory of Modern Optical Instrumentation, Department of Optical Engineering, Zhejiang University, Hangzhou 310027 (China)
  • 2. Department of Electrical and Computer Engineering, University of Houston, Houston, TX 77204-4005 (United States)

Description

A large defect-induced sub-bandgap photoresponse over a broad spectral range is observed in semiconductor single nanowires via optical waveguiding excitation. Using an evanescent coupling technique, the excitation sub-bandgap light is efficiently transferred from a silica fiber taper into a CdS single nanowire (bandgap ∼ 2.46 eV), and is tightly confined and guided through the whole length of the nanowire, which significantly enhances the light-defect interaction compared with the conventional irradiation excitation scheme. Under 593 nm wavelength (∼2.09 eV) waveguiding excitation with an input power of 10 pW level at room temperature, a 350 nm diameter 150 μm-length CdS nanowire shows a responsivity of 250 A W-1, offering a sub-bandgap photosensitivity five orders of magnitude larger than by irradiation excitation. These results may open opportunities for noninvasive characterization of defect states in semiconductor nanowires, as well as for enabling novel sub-bandgap nanowire devices.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/22/42/425201

Additional details

Identifiers

DOI
10.1088/0957-4484/22/42/425201;
PII
S0957-4484(11)87705-6;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
22
Journal Issue
42
Journal Page Range
[5 p.]
ISSN
0957-4484