Quantitative analysis of multi-elements including fluorine in spring- and hot-spring water samples taken around Mt. Iwate by a PIXE system
- 1. Japan Radioisotope Association, Takizawa Institute, Takizawa, Iwate (Japan)
- 2. Iwate Medical Univ., Cyclotron Research Center, Takizawa, Iwate (Japan)
Description
A three-detector measuring system by the use of a Pure-Ge detector and two Si(Li) detectors was established at Nishina Memorial Cyclotron Center (NMCC). Japan Radioisotope Association, and a method of quantitative analysis of fluorine has been developed by measuring 110 keV prompt γ-rays from F as well as characteristic X-rays from other elements, simultaneously. In this study, we have measured fluorine concentration in spring- and hot-spring-water samples taken from the eleven sampling sites around Mt. Iwate, and compared with those of other elements present. As a result, fluorine concentration is found to be 0.30-2.25 ppm in these water samples. As the present method allows us to obtain fluorine concentration simply and quickly in comparison with other methods, and concentrations of other elements simultaneously, its application to environmental studies is promising. The variations of fluorine concentration with passage of time in hot spring water were not observed as well as those of other elements. (author)
Additional details
Publishing Information
- Journal Title
- Radioisotopes (Tokyo)
- Journal Volume
- 54
- Journal Issue
- 7
- Journal Page Range
- p. 205-212
- ISSN
- 0033-8303
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 36084023
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ENVIRONMENTAL MATERIALS; FLUORINE; FLUORINE 19; HIGH-PURITY GE DETECTORS; HOT SPRINGS; JAPAN; LI-DRIFTED SI DETECTORS; MINERAL SPRINGS; MULTI-ELEMENT ANALYSIS; PIXE ANALYSIS; PROMPT GAMMA RADIATION
- Descriptors DEC
- ASIA; CHEMICAL ANALYSIS; DEVELOPED COUNTRIES; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUORINE ISOTOPES; GAMMA RADIATION; GE SEMICONDUCTOR DETECTORS; HALOGENS; IONIZING RADIATIONS; ISOTOPES; LI-DRIFTED DETECTORS; LIGHT NUCLEI; MATERIALS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEI; ODD-EVEN NUCLEI; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; STABLE ISOTOPES; THERMAL SPRINGS; WATER SPRINGS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 7 refs., 6 figs., 4 tabs.