Using high numerical aperture objective lens in micro-reflectance difference spectrometer
Creators
Description
Highlights: • Investigating the anisotropic effect of high NA objective lens through mathematical approaches of vectorial ray-tracing method and Debye–Wolf integral. • A micro-RDS based on liquid crystal variable retarder (LCVR) in the visible range was built. • An in-situ calibration method was presented to effectively suppress the most easily induced asymmetric error. • The broad band RD spectroscopy of black phosphorus film on Si/SiO2 substrate was obtained. - Abstract: The large convergence angle of high numerical aperture (NA) objective lens is an obstacle to develop a high spatial resolution micro-reflectance difference spectrometer (micro-RDS). Here, we figure out the anisotropic signal mapping of the high NA objective lens induced to micro-RDS using mathematical approaches of vectorial ray-tracing method and Debye–Wolf integral. The spatial symmetry of the RD signal promises a value of zero by the integral over the light beam profile under the condition that the micro-RDS system is perfectly symmetrical. Thus, the RDS system needs to be more strictly symmetrical when a larger NA objective lens is utilized. For demonstration, a micro-RDS based on liquid crystal variable retarder was built. An in-situ calibration method was developed to eliminate the testing errors introduced by the asymmetry of the optical system. As a result, the measurement precision of the setup is better than ±0.002 when a 100× objective (NA = 0.9) is used. Finally, to demonstrate the performance of the micro-RDS, we measured the layered black phosphorus using 50× and 100× objective lenses, respectively, and observed a scaled factor tuning the amplitude of the real part of RD signal when a sample is smaller than the light spot. The origins of the scaled factor are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2016.12.166Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2016.12.166;
- PII
- S0169-4332(16)32897-5;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 421
- Journal Issue
- Part B
- Journal Page Range
- p. 535-541
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 7. international conference on spectroscopic ellipsometry
- Acronym
- ICSE-7
- Dates
- 6-10 Jun 2016
- Place
- Berlin (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49066172
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ANISOTROPY; ASYMMETRY; BEAM PROFILES; CALIBRATION; INTEGRALS; LENSES; LIQUID CRYSTALS; OPTICAL SYSTEMS; PHOSPHORUS; SIGNALS; SILICA; SILICON OXIDES; SPATIAL RESOLUTION; SPECTROMETERS; SPECTROSCOPY; SUBSTRATES
- Descriptors DEC
- CHALCOGENIDES; CRYSTALS; ELEMENTS; FLUIDS; LIQUIDS; MEASURING INSTRUMENTS; MINERALS; NONMETALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RESOLUTION; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.