Published November 1, 2017 | Version v1
Journal article

Using high numerical aperture objective lens in micro-reflectance difference spectrometer

Description

Highlights: • Investigating the anisotropic effect of high NA objective lens through mathematical approaches of vectorial ray-tracing method and Debye–Wolf integral. • A micro-RDS based on liquid crystal variable retarder (LCVR) in the visible range was built. • An in-situ calibration method was presented to effectively suppress the most easily induced asymmetric error. • The broad band RD spectroscopy of black phosphorus film on Si/SiO2 substrate was obtained. - Abstract: The large convergence angle of high numerical aperture (NA) objective lens is an obstacle to develop a high spatial resolution micro-reflectance difference spectrometer (micro-RDS). Here, we figure out the anisotropic signal mapping of the high NA objective lens induced to micro-RDS using mathematical approaches of vectorial ray-tracing method and Debye–Wolf integral. The spatial symmetry of the RD signal promises a value of zero by the integral over the light beam profile under the condition that the micro-RDS system is perfectly symmetrical. Thus, the RDS system needs to be more strictly symmetrical when a larger NA objective lens is utilized. For demonstration, a micro-RDS based on liquid crystal variable retarder was built. An in-situ calibration method was developed to eliminate the testing errors introduced by the asymmetry of the optical system. As a result, the measurement precision of the setup is better than ±0.002 when a 100× objective (NA = 0.9) is used. Finally, to demonstrate the performance of the micro-RDS, we measured the layered black phosphorus using 50× and 100× objective lenses, respectively, and observed a scaled factor tuning the amplitude of the real part of RD signal when a sample is smaller than the light spot. The origins of the scaled factor are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2016.12.166

Additional details

Identifiers

DOI
10.1016/j.apsusc.2016.12.166;
PII
S0169-4332(16)32897-5;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
421
Journal Issue
Part B
Journal Page Range
p. 535-541
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
7. international conference on spectroscopic ellipsometry
Acronym
ICSE-7
Dates
6-10 Jun 2016
Place
Berlin (Germany)

INIS

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.