Published 1993 | Version v1
Book

Recent advances in avalanche photodiode technology

  • 1. Radiation Monitoring Devices, Inc., Watertown, MA (United States)

Description

Avalanche photodiodes (APDs) are solid state devices having an internal signal gain which gives them a better signal-to-noise ratio than standard photodiodes. Also, their high quantum efficiency provides an advantage over photomultiplier tubes in some applications. Although they have been studied for years, recent advances in the fabrication techniques have allowed the construction of multielement arrays (up to 10 x 10) with high performance capability. This progress has resulted in increased potential for exploiting the advantages of APDs in a variety of research, industrial nondestructive testing, medical instrumentation, and biomedical research using low energy particles. For example, the direct detection of the distribution of tritium labeled, beta emitting compounds has been achieved. No other solid state detector is capable of doing this. Recent experimental data characterizing APDs and APD arrays used as x-ray, particle and low level light detectors are presented. In addition, their suitability in various applications is discussed

Additional details

Publishing Information

Publisher
SPIE--The International Society for Optical Engineering.
Imprint Place
Bellingham, WA (United States)
ISBN
0-8194-1258-9
Imprint Title
X-ray detector physics and applications II
Imprint Pagination
283 p.
Series
Proceedings/SPIE, Volume 2009.
Journal Page Range
p. 64-71.

Conference

Title
Annual meeting of the Society of Photo-Optical Instrumentation Engineers (SPIE).
Dates
11-16 Jul 1993.
Place
San Diego, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
27045390
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGED PARTICLE DETECTION; PERFORMANCE; PHOTODIODES; RADIATION DETECTORS; TECHNOLOGY ASSESSMENT; USES; X-RAY DETECTION
Descriptors DEC
DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES

Optional Information

Secondary number(s)
CONF-930722--.