Published February 19, 1980
| Version v1
Patent
X-ray measuring system
Creators
Description
A digital x-ray system measures the x-ray beam quality such as the peak voltage applied to the x-ray tube and/or half value layer of the x-ray beam
Availability note (English)
U.S. Commissioner of Patents, Washington, D.C. 20231, USA, $.50.Additional details
Additional titles
- Augmented title (English)
- Patent
Publishing Information
- Imprint Pagination
- v p.
- IPC:
- Int. Cl.H05G 1/26.
- IPC
- Int. Cl.H05G 1/26.
- Patent number
- US patent document 4,189,645/A/
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 13684733
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- BEAM MONITORING; COPPER; DIGITAL SYSTEMS; ELECTRIC POTENTIAL; FILTERS; MEASURING METHODS; X-RAY DETECTION
- Descriptors DEC
- ELEMENTS; METALS; MONITORING; RADIATION DETECTION; TRANSITION ELEMENTS
Optional Information
- Notes
- PAT-APPL-919758.