Nonstationary oscillations in gyrotrons revisited
Creators
- 1. Institute of Solid State Physics, University of Latvia, Kengaraga Street 8, LV-1063 Riga (Latvia)
- 2. Institute of Mathematics and Computer Science, University of Latvia, Raiņa bulv. 29, LV-1459 Riga (Latvia)
Description
Development of gyrotrons requires careful understanding of different regimes of gyrotron oscillations. It is known that in the planes of the generalized gyrotron variables: cyclotron resonance mismatch and dimensionless current or cyclotron resonance mismatch and dimensionless interaction length complicated alternating sequences of regions of stationary, periodic, automodulation, and chaotic oscillations exist. In the past, these regions were investigated on the supposition that the transit time of electrons through the interaction space is much shorter than the cavity decay time. This assumption is valid for short and/or high diffraction quality resonators. However, in the case of long and/or low diffraction quality resonators, which are often utilized, this assumption is no longer valid. In such a case, a different mathematical formalism has to be used for studying nonstationary oscillations. One example of such a formalism is described in the present paper
Additional details
Identifiers
- DOI
- 10.1063/1.4921665;
Publishing Information
- Journal Title
- Physics of Plasmas
- Journal Volume
- 22
- Journal Issue
- 5
- Journal Page Range
- p. 053113-053113.6
- ISSN
- 1070-664X
- CODEN
- PHPAEN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46116203
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CAVITY RESONATORS; CYCLOTRON RESONANCE; DIFFRACTION; ELECTRONS; INTERACTIONS; MICROWAVE AMPLIFIERS; OSCILLATIONS
- Descriptors DEC
- AMPLIFIERS; COHERENT SCATTERING; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; LEPTONS; MICROWAVE EQUIPMENT; RESONANCE; RESONATORS; SCATTERING
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC