Published May 2014 | Version v1
Journal article

High-resolution alpha-particle spectrometry of 238U

  • 1. European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, Retieseweg 111, B-2440 Geel (Belgium)
  • 2. Laboratorio de Metrología de Radiaciones Ionizantes, CIEMAT, Avda. Complutense 22, 28040 Madrid (Spain)

Description

The alpha-particle emission probabilities associated with the three main alpha transitions of 238U were measured by high-resolution alpha-particle spectrometry. Highly enriched 238U material was used and its isotopic composition characterised by mass spectrometry. Source production through electrodeposition was optimised to reconcile conflicting demands for good spectral resolution and statistical precision. Measurements were performed at IRMM and CIEMAT for 1–2 years in three different set-ups. A new magnet system was put into use to largely eliminate true coincidence effects with low-energy conversion electrons. Finally the accuracy and precision of the relative emission probabilities for the three transitions – 77.01 (10)%, 22.92 (10)% and 0.068 (10)%, respectively – have been improved significantly. - Highlights: • Measured alpha-particle emission probabilities in the decay of 238U. • Used high-resolution alpha-particle spectrometry on electrodeposited sources. • Improved accuracy and precision significantly. • Results are Pα,0=77.01 (10)%, Pα,1=22.92 (10)% and Pα,2=0.068 (10)%

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apradiso.2013.11.075

Additional details

Identifiers

DOI
10.1016/j.apradiso.2013.11.075;
PII
S0969-8043(13)00524-1;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
87
Journal Page Range
p. 315-319
ISSN
0969-8043
CODEN
ARISEF

Conference

Title
19. international conference on radionuclide metrology and its applications
Dates
17-21 Jun 2013
Place
Antwerp (Belgium)

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.