Published February 2010 | Version v1
Journal article Metadata-only

Testing efficiency transfer codes for equivalence

Creators

  • 1. European Commission, JRC, IRMM, Geel (Belgium)
  • 2. Karadeniz Technical University, Trabzon (Turkey)
  • 3. Centro de Proteccion e Higiene de las Radiaciones, La Habana (Cuba)
  • 4. University of Montenegro, Podgorica (Montenegro)
  • 5. Ahmadu Bello University, Zaria (Nigeria)
  • 6. Commissariat a l'Energie Atomique, Gif sur Yvette Cedex (France)
  • 7. Bucharest University, Bucharest (Romania)
  • 8. National Centre for Scientific Research 'Demokritos', Athens (Greece)
  • 9. University of Extremadura, Badajoz (Spain)
  • 10. National Technical University of Athens, Athens (Greece)
  • 11. University Rehabilitation Institute, Ljubljana (Slovenia)

Description

Four general Monte Carlo codes (GEANT3, PENELOPE, MCNP and EGS4) and five dedicated packages for efficiency determination in gamma-ray spectrometry (ANGLE, DETEFF, GESPECOR, ETNA and EFFTRAN) were checked for equivalence by applying them to the calculation of efficiency transfer (ET) factors for a set of well-defined sample parameters, detector parameters and energies typically encountered in environmental radioactivity measurements. The differences between the results of the different codes never exceeded a few percent and were lower than 2% in the majority of cases.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apradiso.2009.10.012

Additional details

Identifiers

DOI
10.1016/j.apradiso.2009.10.012;
PII
S0969-8043(09)00629-0;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
68
Journal Issue
2
Journal Page Range
p. 355-359
ISSN
0969-8043
CODEN
ARISEF

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41062565
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
EFFICIENCY; GAMMA SPECTROSCOPY; GE SEMICONDUCTOR DETECTORS; IMPURITIES; MONTE CARLO METHOD; RADIOACTIVITY; TESTING
Descriptors DEC
CALCULATION METHODS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.