A laboratory based system for Laue micro x-ray diffraction
Creators
- 1. Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 (United States)
- 2. Commonwealth Scientific and Industrial Research Organization, Manufacturing and Infrastructure Technology, Private Bag 33, Clayton South MDC, 3169 (Australia)
Description
A laboratory diffraction system capable of illuminating individual grains in a polycrystalline matrix is described. Using a microfocus x-ray source equipped with a tungsten anode and prefigured monocapillary optic, a micro-x-ray diffraction system with a 10 μm beam was developed. The beam profile generated by the ellipsoidal capillary was determined using the ''knife edge'' approach. Measurement of the capillary performance, indicated a beam divergence of 14 mrad and a useable energy bandpass from 5.5 to 19 keV. Utilizing the polychromatic nature of the incident x-ray beam and application of the Laue indexing software package X-Ray Micro-Diffraction Analysis Software, the orientation and deviatoric strain of single grains in a polycrystalline material can be studied. To highlight the system potential the grain orientation and strain distribution of individual grains in a polycrystalline magnesium alloy (Mg 0.2 wt % Nd) was mapped before and after tensile loading. A basal (0002) orientation was identified in the as-rolled annealed alloy; after tensile loading some grains were observed to undergo an orientation change of 30 deg. with respect to (0002). The applied uniaxial load was measured as an increase in the deviatoric tensile strain parallel to the load axis
Additional details
Identifiers
- DOI
- 10.1063/1.2437777;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 78
- Journal Issue
- 2
- Journal Page Range
- p. 023904-023904.10
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104537
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; ANODES; BEAM PROFILES; BEAMS; COMPUTER CODES; CRYSTAL STRUCTURE; GRAIN ORIENTATION; KEV RANGE; MAGNESIUM ALLOYS; NEODYMIUM ALLOYS; POLYCRYSTALS; RESIDUAL STRESSES; STRAINS; TUNGSTEN; X RADIATION; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; X-RAY SOURCES
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; DIFFRACTOMETERS; ELECTRODES; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; HEAT TREATMENTS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; MICROSTRUCTURE; ORIENTATION; RADIATION SOURCES; RADIATIONS; RARE EARTH ALLOYS; REFRACTORY METALS; SCATTERING; STRESSES; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2007 American Institute of Physics