Replication of surfaces of natural leaves for enhanced micro-scale tribological property
Creators
- 1. Microsystem Research Center, Future Technology Research Division, Korea Institute of Science and Technology, Seoul 130-650 (Korea, Republic of)
- 2. School of Mechanical and Aerospace Engineering and Institute of Advanced Machinery and Design, Seoul National University, Seoul 151-742 (Korea, Republic of)
Description
In this paper, we report on the replication of surfaces of Lotus and Colocasia leaves onto thin polymeric films using a capillarity-directed soft lithographic technique. The replication was carried out on poly(methyl methacrylate) (PMMA) film spin coated on silicon wafer using poly(dimethyl siloxane) (PDMS) molds. The friction properties of the replicated surfaces were investigated at micro-scale in comparison with those of PMMA thin film and uncoated silicon wafer. The coefficients of friction of the replicated surfaces were almost five times lower than those of the PMMA thin film and four times lower than those of the uncoated silicon wafer. The superior micro-tribological properties of the replicated surfaces could be attributed to the reduced real area of contact projected by the surfaces
Additional details
Identifiers
- DOI
- 10.1016/j.msec.2006.10.007;
- PII
- S0928-4931(06)00359-6;
Publishing Information
- Journal Title
- Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
- Journal Volume
- 27
- Journal Issue
- 4
- Journal Page Range
- p. 875-879
- ISSN
- 0928-4931
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39030272
- Subject category
- S60: APPLIED LIFE SCIENCES;
- Descriptors DEI
- FRICTION; FUNGI; LEAVES; METHACRYLIC ACID ESTERS; PMMA; SILICON; SPIN; THIN FILMS; TRIBOLOGY
- Descriptors DEC
- ANGULAR MOMENTUM; CARBOXYLIC ACID ESTERS; ELEMENTS; ESTERS; FILMS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE PROPERTIES; PLANTS; POLYACRYLATES; POLYMERS; POLYVINYLS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.