Published January 2007 | Version v1
Journal article

Study of pore structure in grafted polymer membranes using slow positron beam and small-angle X-ray scattering techniques

  • 1. Radiochemistry Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400 085 (India)
  • 2. Solid State Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400 085 (India)
  • 3. Material Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India)

Description

Pore structure in polypropylene membranes has been investigated using slow positron beam and small-angle X-ray scattering (SAXS) studies. The pore structure has been modified by chemically grafting methylmethacrylate in polypropylene. Depth-resolved Doppler lineshape S-parameter and positronium (Ps) fraction (3γ/2γ ratio) measurements have been carried out using a variable low energy positron beam. Lineshape S-parameter and Ps fraction are found to decrease with the extent of grafting. The deduced positron diffusion length is also seen to decrease with the extent of pore grafting. The power law dependence of SAXS intensity over a wide range of the wave vector transfer reveals the fractal nature of the pore-membrane surface and, the surface fractal dimensions are seen to increase with amount of pore grafting. The value of the negative exponent of the power law size distribution of the pores has been found to be increasing with increase in grafting revealing reduction in the pore size and narrower pore size distribution. The deduced pore size from SAXS measurements is correlated with positron diffusion length and S-parameter from the positron beam measurements

Additional details

Identifiers

DOI
10.1016/j.nimb.2006.11.052;
PII
S0168-583X(06)01154-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
254
Journal Issue
2
Journal Page Range
p. 278-282
ISSN
0168-583X
CODEN
NIMBEU

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.