Spectral modifications and enhancement of red light yield tailored by Y3+ incorporation in the SrGd1.94Eu0.06O4 system
Creators
- 1. Galgotias University, School of Basic and Applied Sciences (India)
- 2. Ghent University, Department of Solid State Sciences (Belgium)
- 3. Bhilai Institute of Technology Raipur, Department of Physics (India)
Description
The enhancement in luminescence efficiency and spectral tuning due to Y3+ incorporation in the SrGd1.94Eu0.06O4 phosphor is reported. An auto-combustion method was adopted to synthesize the samples. The structural, morphological and luminescence properties were examined by means of X-ray diffraction, field-emission scanning electron microscopy (FESEM) and photoluminescence (PL) studies. The substitution of Gd3+ ions by Y3+ ions modulates the sensitizing effects of Gd3+ ions and also causes lattice shrinkage which alters the local crystal structure and improves the red light yield of Eu3+ ions. The spectroscopic modification occurring due to the incorporation of Y3+ ions was investigated with the help of Judd–Ofelt calculations. Temperature dependent PL studies were performed to investigate the thermal stability of the samples. The present research indicates that the SrGd1.94−xYxEu0.06O4 system can be used as a suitable red component for display and lighting applications.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 23
- Journal Page Range
- p. 20665-20672
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52023592
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL STRUCTURE; EUROPIUM IONS; GADOLINIUM IONS; MODIFICATIONS; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION; YIELDS; YTTRIUM IONS
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; IONS; LUMINESCENCE; MICROSCOPY; PHOTON EMISSION; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature