Characterization of individual complex particles in urban atmospheric environment
Creators
- 1. Faculty of Science and Technology, Science University of Tokyo, 2641 Yamazaki, Noda-shi, Chiba 278-8510 (Japan)
- 2. Environmental Science Center, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)
Description
The origins of carrier particles of complex particles (iron-rich particles) collected from the urban atmospheric environment near to road traffic and a railroad were investigated from the detailed surface information using FE-SEM/EDS and TOF-SIMS analyses. From the FE-SEM/EDS analyses, the iron-rich particles were classified into two typical types (spherical type and non-spherical type). From the TOF-SIMS measurements, the characteristic secondary ions of spherical type of iron-rich particles were 23Na+ and 39K+. The minor components of non-spherical type were Al, Ca and Ba. On the other hand, we carried out TOF-SIMS measurement to materials of rail origin and brake origin. From the comparison of these spectra pattern, it seemed that the spherical type of iron-rich particles was emitted from the rail origin. We concluded that the origin of non-spherical type of iron-rich particles were brake pad of vehicles
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2006.02.173;
- PII
- S0169-4332(06)00513-7;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 252
- Journal Issue
- 19
- Journal Page Range
- p. 7022-7025
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 15. International conference on secondary ion mass spectrometry
- Acronym
- SIMS XV
- Dates
- 12-16 Oct 2005
- Place
- Manchester (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104155
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ENVIRONMENT; ION MICROPROBE ANALYSIS; IRON; MASS SPECTROSCOPY; PARTICLES; POTASSIUM IONS; SCANNING ELECTRON MICROSCOPY; SODIUM IONS; SURFACES
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTS; IONS; METALS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.