Published July 30, 2006 | Version v1
Journal article

Characterization of individual complex particles in urban atmospheric environment

  • 1. Faculty of Science and Technology, Science University of Tokyo, 2641 Yamazaki, Noda-shi, Chiba 278-8510 (Japan)
  • 2. Environmental Science Center, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

Description

The origins of carrier particles of complex particles (iron-rich particles) collected from the urban atmospheric environment near to road traffic and a railroad were investigated from the detailed surface information using FE-SEM/EDS and TOF-SIMS analyses. From the FE-SEM/EDS analyses, the iron-rich particles were classified into two typical types (spherical type and non-spherical type). From the TOF-SIMS measurements, the characteristic secondary ions of spherical type of iron-rich particles were 23Na+ and 39K+. The minor components of non-spherical type were Al, Ca and Ba. On the other hand, we carried out TOF-SIMS measurement to materials of rail origin and brake origin. From the comparison of these spectra pattern, it seemed that the spherical type of iron-rich particles was emitted from the rail origin. We concluded that the origin of non-spherical type of iron-rich particles were brake pad of vehicles

Additional details

Identifiers

DOI
10.1016/j.apsusc.2006.02.173;
PII
S0169-4332(06)00513-7;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
252
Journal Issue
19
Journal Page Range
p. 7022-7025
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
15. International conference on secondary ion mass spectrometry
Acronym
SIMS XV
Dates
12-16 Oct 2005
Place
Manchester (United Kingdom)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38104155
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENVIRONMENT; ION MICROPROBE ANALYSIS; IRON; MASS SPECTROSCOPY; PARTICLES; POTASSIUM IONS; SCANNING ELECTRON MICROSCOPY; SODIUM IONS; SURFACES
Descriptors DEC
CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTS; IONS; METALS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.