Published February 1, 2007 | Version v1
Journal article

Effects of the neutrino electromagnetic form factors on the neutrino and antineutrino mean free paths difference in dense matter

  • 1. Departemen Fisika, FMIPA, Universitas Indonesia, Depok, 16424 (Indonesia)

Description

We have studied the effects of the nucleon weak magnetism and neutrino electromagnetic properties on the mean free paths difference between neutrino and antineutrino for all types of neutrinos. In the calculation, we consider matters with and without neutrino trapping as the targets. We have found that the difference depends on the neutrino energy, the matter used and the effect of different constituents in matter which manifests itself in different ways for each type of neutrino. Compared to the nucleon weak magnetism, the neutrino electromagnetic properties are found to have negligible effect on the mean free path difference

Additional details

Identifiers

DOI
10.1016/j.nuclphysa.2006.10.034;
arXiv
arXiv:nucl-th/0608080v1;
PII
S0375-9474(06)00725-1;

Publishing Information

Journal Title
Nuclear Physics. A
Journal Volume
782
Journal Issue
1-4
Journal Page Range
p. 400-405
ISSN
0375-9474
CODEN
NUPABL

Conference

Title
Particle-nucleus and nucleus-nucleus scattering at relativistic energies
Acronym
5. international conference on perspectives in hadron physics
Dates
22-26 May 2006
Place
Trieste (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38087474
Subject category
S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANTINEUTRINOS; ELECTROMAGNETIC FORM FACTORS; MAGNETISM; MEAN FREE PATH; NUCLEONS; PARTICLE STRUCTURE; TRAPPING
Descriptors DEC
ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BARYONS; DIMENSIONLESS NUMBERS; ELEMENTARY PARTICLES; FERMIONS; FORM FACTORS; HADRONS; LEPTONS; MASSLESS PARTICLES; MATTER; NEUTRINOS; PARTICLE PROPERTIES

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.