Published August 2008 | Version v1
Journal article

Absorptive reduction and width narrowing in λ-type atoms confined between two dielectric walls

  • 1. Institute of Photonics and Photonic Technology, Key Laboratory of Photoelectronic Technology of Shaanxi Province, Northwest University, Xi'an 710069 (China)
  • 2. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049 (China)

Description

This paper investigates the absorptive reduction and the width narrowing of electromagnetically induced transparency (EIT) in a thin vapour film of λ-type atoms confined between two dielectric walls whose thickness is comparable with the wavelength of the probe field. The absorptive lines of the weak probe field exhibit strong reductions and very narrow EIT dips, which mainly results from the velocity slow-down effects and transient behaviour of atoms in a confined system. It is also shown that the lines are modified by the strength of the coupling field and the ratio of L/λ, with L the film thickness and λ the wavelength of the probe field. A simple robust recipe for EIT in a thin medium is achievable in experiment. (general)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/17/8/022

Additional details

Identifiers

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
17
Journal Issue
8
Journal Page Range
p. 2885-2889
ISSN
1674-1056