High power excimer laser-generated plasma source for x-ray microlithography
Creators
- 1. JMAR Technology Co., San Diego, CA (United States)
- 2. Rutherford Appleton Lab., Chilton (United Kingdom)
- 3. IBM Microelectronics, Hopewell Junction, NY (United States)
- 4. Naval Research Lab., Washington, DC (United States)
- 5. SFA, Inc., Landover, MD (United States)
Description
This paper describes a high-intensity, high pulse-repetition-rate picosecond-pulse excimer laser system and plasma x-ray source, which generates up to 3 W of average x-ray power, into 2π steradians, in a spectral band from 10--16 angstrom. The XeCl excimer laser system output, at 308 nm, consists of a train of 16 pulses, each ∼45 ps in duration and spaced by 2 ns. The energy of each pulse in the train is ∼25 mJ, and the pulse-train repetition rate is 60 Hz. Each pulse in the train is focused to a spot of <10 microm diameter on a metal tape target, resulting in an intensity of 1 x 1015 W cm-2. Spectral and spatial characteristics of the x-ray emission have been studied, and the laser energy to x-ray dose conversion efficiency has been measured in an experiment which simulates the x-ray lithography process. Lithographic efficiencies of 5.9% and 10.9% have been measured for copper and stainless steel targets, respectively
Additional details
Publishing Information
- Publisher
- SPIE-The International Society for Optical Engineering.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-1882-X
- Imprint Title
- Applications of laser plasma radiation 2
- Imprint Pagination
- 333 p.
- Series
- Proceedings/SPIE, Volume 2523.
- Journal Page Range
- p. 122-128.
Conference
- Title
- SPIE applications of laser plasma radiation II.
- Dates
- 12-14 Jul 1995.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28005348
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- EXPERIMENTAL DATA; FABRICATION; INTEGRATED CIRCUITS; LASER-PRODUCED PLASMA; MASKING; PERFORMANCE; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- DATA; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; INFORMATION; IONIZING RADIATIONS; NUMERICAL DATA; PLASMA; RADIATION SOURCES; RADIATIONS
Optional Information
- Secondary number(s)
- CONF-9507222--.