Published 1995 | Version v1
Book

High power excimer laser-generated plasma source for x-ray microlithography

  • 1. JMAR Technology Co., San Diego, CA (United States)
  • 2. Rutherford Appleton Lab., Chilton (United Kingdom)
  • 3. IBM Microelectronics, Hopewell Junction, NY (United States)
  • 4. Naval Research Lab., Washington, DC (United States)
  • 5. SFA, Inc., Landover, MD (United States)

Description

This paper describes a high-intensity, high pulse-repetition-rate picosecond-pulse excimer laser system and plasma x-ray source, which generates up to 3 W of average x-ray power, into 2π steradians, in a spectral band from 10--16 angstrom. The XeCl excimer laser system output, at 308 nm, consists of a train of 16 pulses, each ∼45 ps in duration and spaced by 2 ns. The energy of each pulse in the train is ∼25 mJ, and the pulse-train repetition rate is 60 Hz. Each pulse in the train is focused to a spot of <10 microm diameter on a metal tape target, resulting in an intensity of 1 x 1015 W cm-2. Spectral and spatial characteristics of the x-ray emission have been studied, and the laser energy to x-ray dose conversion efficiency has been measured in an experiment which simulates the x-ray lithography process. Lithographic efficiencies of 5.9% and 10.9% have been measured for copper and stainless steel targets, respectively

Additional details

Publishing Information

Publisher
SPIE-The International Society for Optical Engineering.
Imprint Place
Bellingham, WA (United States)
ISBN
0-8194-1882-X
Imprint Title
Applications of laser plasma radiation 2
Imprint Pagination
333 p.
Series
Proceedings/SPIE, Volume 2523.
Journal Page Range
p. 122-128.

Conference

Title
SPIE applications of laser plasma radiation II.
Dates
12-14 Jul 1995.
Place
San Diego, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28005348
Subject category
S07: ISOTOPES AND RADIATION SOURCES; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
EXPERIMENTAL DATA; FABRICATION; INTEGRATED CIRCUITS; LASER-PRODUCED PLASMA; MASKING; PERFORMANCE; X RADIATION; X-RAY SOURCES
Descriptors DEC
DATA; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; INFORMATION; IONIZING RADIATIONS; NUMERICAL DATA; PLASMA; RADIATION SOURCES; RADIATIONS

Optional Information

Secondary number(s)
CONF-9507222--.