Published January 15, 1978 | Version v1
Journal article Metadata-only

X-ray analysis of thick targets with α-particles

Creators

  • 1. Bonn Univ. (Germany, F.R.). Inst. fuer Strahlen- und Kernphysik

Description

The applicability of the particle induced X-ray emission (PIXE) method for general quantitative analyses of thick samples, e.g. coins, is shown. Test measurements with metal targets of known composition were done with α-particles of 30 MeV. The abundances agree very well. The accuracy achievable by this method is given. It is better that 0.5 weight % for abundances less than 10%. (Auth.)

Additional details

Identifiers

DOI
10.1016/0029-554x(70)90197-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
148
Journal Issue
2
Series
Nucl. Instrum. Methods.
Journal Page Range
407-413
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
9378092
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ACCURACY; ALPHA BEAMS; ELEMENT ABUNDANCE; ELEMENTS; LI-DRIFTED SI DETECTORS; MEV RANGE 10-100; MULTI-ELEMENT ANALYSIS; TRACE AMOUNTS; X-RAY EMISSION ANALYSIS; X-RAY SPECTRA
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; ENERGY RANGE; HELIUM 4 BEAMS; ION BEAMS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEV RANGE; NONDESTRUCTIVE ANALYSIS; QUANTITY RATIO; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA

Optional Information

Notes
Updated automatically by Metadata and Full-Text Enrichment Agent