Published 1975 | Version v1
Report Restricted

Response of nuclear emulsions to ionizing radiations

Description

Heavy ion tracks in Ilford K-2 emulsion are simulated with a computer program which makes use of the delta-ray theory of track structure, and the special assumption that the response of this emulsion to gamma-rays is 8-or-more hit. The Ilford K-series of nuclear emulsions is produced from a parent stock called K.0 emulsion, sensitized to become K.1 to K.5, and desensitized to become K-1 to K-3. Our simulations demonstrate that the emulsions K.5 through K.0 to K-1 are 1-or-more hit detectors, while K-2 is an 8-or-more hit detector. We have no data for K-3 emulsion. It would appear that emulsions of intermediate hittedness might be produced by an intermediate desensitization, to mimic or match the RBE-LET variations of biological cells, perhaps to produce a ''rem-dosimeter''. In the K-2 emulsion no developable gains are produced by stopping H, He, and Li ions. The emulsion has ''threshold-like'' properties, resembling etchable track detectors. It should prove useful in the measurement of high LET dose in a strong low LET background, as for pions or neutrons. Since it can be expected to accumulate and repair ''sub-lethal damage'', to display the ion-kill and gamma-kill inactivation modes, the grain-count and track width regimes, it may serve to model biological effects. (auth)

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
33 p.
Report number
COO--1671-62

Conference

Title
5. symposium on microdosimetry.
Dates
22 Sep 1975.
Place
Varbania Pallanza, Italy.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7229309
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTER CALCULATIONS; HEAVY IONS; ION DOSIMETRY; NUCLEAR EMULSIONS; SENSITIVITY; SIMULATION
Descriptors DEC
CHARGED PARTICLES; DOSIMETRY; IONS

Optional Information

Secondary number(s)
CONF-750927--2.