Highly collimated light emission of deep-ultraviolet light-emitting diodes using Fresnel zone plate nanodiffraction patterns
Creators
- 1. Advanced ICT Research Institute, National Institute of Information and Communications Technology (NICT), Kobe, 651-2492 (Japan)
Description
Fresnel zone plates (FZPs) are diffractive optical structures composed of many symmetrical concentric rings and are widely used in nanofocusing and beam collimation. In this article, the effect of substrate thickness on the beam collimation and light-extraction efficiency (LEE) enhancement of deep-ultraviolet (DUV) micro-light-emitting diodes (micro-LEDs) with FZPs are experimentally analyzed. The far-field patterns and LEE enhancements of the DUV micro-LEDs are effectively controlled by the FZPs. Optimization of the substrate thickness provides FZP-containing DUV micro-LEDs that display highly collimated, optics-free emission with an emission-angle full width at half maximum of 9° and high LEE enhancement of 1.4 times. (© 2024 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.202400081Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 221
- Journal Issue
- 21
- Journal Page Range
- p. 1-6
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 56000817
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM NITRIDES; BEAM OPTICS; COLLIMATORS; DIFFRACTION METHODS; EFFICIENCY; EMISSION SPECTRA; EXTREME ULTRAVIOLET RADIATION; FABRICATION; LIGHT EMITTING DIODES; NANOTECHNOLOGY; OPTIMIZATION; SUBSTRATES; THICKNESS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; DIMENSIONS; ELECTROMAGNETIC RADIATION; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTRA; ULTRAVIOLET RADIATION
Optional Information
- Notes
- AID: 2400081; Nitride semiconductors