Optical properties and surface morphology of evaporated (WO3)1-x-(Fe2O3) x thin films
Creators
- 1. Department of Physics, Sharif University of Technology, P.O. Box 11365-9161, Tehran (Iran, Islamic Republic of)
- 2. Department of Physics, Tehran University, P.O. Box 19395-3667, Tehran (Iran, Islamic Republic of)
Description
Thin films of (WO3)1-x-(Fe2O3) x composition were deposited by thermal evaporation on glass substrates and then all samples were annealed at 400 deg. C in air. Optical properties such as transmittance, reflectance, and optical bandgap energy of the 'as deposited' and the annealed films were studied using ultraviolet-visible spectrophotometry. It was shown that the annealing process did not substantially change the optical transmittance and reflectance of all the films except the films having x = 0.75. By increasing Fe2O3 content in the films from x = 0 to x = 0.75, optical bandgap energy decreased from 3.4 to about 1.3 eV and from 3.1 to 2.1 eV for the 'as deposited' and the annealed samples, respectively. Moreover, using X-ray photoelectron spectroscopy, we have shown that the 'as deposited' (WO3)0.25-(Fe2O3)0.75 films contained Fe3O4, and it converted to Fe2O3 after the annealing process. Using atomic force microscopy, it was found that the grain size and surface roughness of the annealed films were greater than the 'as deposited' ones. In addition, for the annealed films with intermediate x's, we have observed a smoother surface with smaller grain size as compared to films with the other x's
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.02.019;
- PII
- S0040-6090(05)00202-6;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 484
- Journal Issue
- 1-2
- Journal Page Range
- p. 124-131
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37019629
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; EV RANGE 01-10; EVAPORATION; FERRITES; GRAIN SIZE; MORPHOLOGY; OPTICAL PROPERTIES; SPECTROPHOTOMETRY; SURFACES; THIN FILMS; TUNGSTATES; ULTRAVIOLET RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ENERGY RANGE; EV RANGE; FERRIMAGNETIC MATERIALS; FILMS; HEAT TREATMENTS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; MICROSCOPY; MICROSTRUCTURE; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; REFRACTORY METAL COMPOUNDS; SIZE; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.