The broad-band spectrum of the narrow-line Seyfert 1 NGC 4748: from UV to hard X-ray
Creators
- 1. National Academy of Sciences of Ukraine, Main Astronomical Observatory (Ukraine)
Description
We report the results obtained by a broad-band (0.5–500 keV) data analysis of narrow-line Seyfert 1 galaxy NGC 4748 observed with an XMM-Newton/PN, INTEGRAL/ISGRI and SWIFT/BAT telescopes. This galaxy has a soft X-ray excess that is typical for the class of narrow-line Seyfert 1. The question of the origin of soft excess in such objects is still unclear. We tested and compared two spectral models for the soft X-ray spectra based on the different physical scenarios. The first one is based on the Done and Nayakshin model of two-phase accretion disc in a vertical direction, which includes two reflection zones with different ionization levels. According to this model, we found that a highly ionized reflection has the value of ionization and is mostly responsible for the soft excess. This reflection becomes comparable with a low ionized one () in moderate X-ray range. However, this model requires also an additional component at soft energies with eV. The second model is an energetically self-consistent model and assumes that a soft excess arises from optically thick thermal Comptonization of the disc emission. Combination of the UV (from XMM/Optical monitor) and X-ray data in the latter model allowed us to determine a mass of the central black hole of and Eddington ratio . Also, we were not able to rule out one of competing models using only X-ray spectra of NGC 4748.
Additional details
Identifiers
Publishing Information
- Journal Title
- Astrophysics and Space Science
- Journal Volume
- 363
- Journal Issue
- 11
- Journal Page Range
- p. 1-11
- ISSN
- 0004-640X
- CODEN
- APSSBE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51037588
- Subject category
- S79: ASTROPHYSICS, COSMOLOGY AND ASTRONOMY;
- Descriptors DEI
- BLACK HOLES; COMPARATIVE EVALUATIONS; DATA ANALYSIS; EMISSION; GALAXIES; HARD X RADIATION; IONIZATION; KEV RANGE; REFLECTION; SOFT X RADIATION; X-RAY SPECTRA
- Descriptors DEC
- DATA PROCESSING; ELECTROMAGNETIC RADIATION; ENERGY RANGE; EVALUATION; IONIZING RADIATIONS; PROCESSING; RADIATIONS; SPECTRA; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2018 Springer Nature B.V.