Published November 1986
| Version v1
Journal article
Decay rate plot of stored beam current and Touschek limit of current-lifetime product
Creators
- 1. Electrotechnical Lab., Sakura, Ibaraki (Japan)
Description
It is demonstrated that the decay rate of the stored beam current I is a good means for indicating the gas-pressure conditions of a storage ring and the stored beam loss due to the Touschek effect. A new analytical method for evaluating the Touschek lifetime of the stored electron beam is also presented. The observed Touschek limit of the current-lifetime product I0τT is 5 Ah at 500 MeV for TERAS. This value is fifty times as large as the theoretical value. I0τT is proportional to the fourth power of the electron energy E and becomes of the order 0.12 Ah at 205 MeV. A computer-made decay-rate plot against I is very useful for indicating the decay modes and the 1/e lifetime of the stored beam current. (author)
Additional details
Publishing Information
- Journal Title
- Jpn. J. Appl. Phys., Part 1
- Journal Volume
- 25
- Journal Issue
- 11
- Series
- Jpn. J. Appl. Phys., Part 1.
- Journal Page Range
- 1706-1710
- ISSN
- 0021-4922
- CODEN
- JAPND
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 18082926
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BEAM CURRENTS; DECAY; ELECTRON BEAMS; ENERGY DEPENDENCE; GASES; LIFETIME; PHOTODIODES; PRESSURE DEPENDENCE; SCATTERING; STORAGE RINGS; VACUUM SYSTEMS
- Descriptors DEC
- BEAMS; CURRENTS; FLUIDS; LEPTON BEAMS; PARTICLE BEAMS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES