Swift heavy ion-based materials science research at NSC
Description
Effects of large electronic excitation in different types of materials, viz. metals, semiconductors, superconductors, polymers and organic crystals are being investigated using the swift heavy ions (SHI) of energies from 10 to 270 MeV available from 15 UD NSC Pelletron. Defect production in semiconductors, structural strain on electronic transport properties of materials having colossal magneto resistance (CMR), flux pinning in high Tc superconductors (HTS), desorption of hydrogen from polymers, ion beam mixing in metal/Si interface and optical waveguide formation are some of our research activities. Resistivity and 1/f noise measurements from room temperature down to 77 K are used for the studies of SHI-induced defects into the materials. Quadrupole mass spectrometer (QMS) in the materials science beam line is used for the studies of radiolysis of polymers induced by SHI. For polymers, ion track diameters have been estimated by on-line monitoring of the loss of hydrogen (using ERD and QMS) during ion irradiation. An ultra high vacuum scanning tunneling microscope (UHV STM) is being installed at the materials science beam line to study the individual damage created by SHI on the solid surfaces. A three-axes goniometer has been installed for RBS-channeling studies of various materials. Experimental facilities and the research work carried out at Nuclear Science Centre are briefed
Additional details
Identifiers
- PII
- S0168583X99002839;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 156
- Journal Issue
- 1-4
- Journal Page Range
- p. 206-211
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33044740
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRON TRANSFER; ENERGY-LEVEL TRANSITIONS; EXCITATION; HEAVY IONS; MAGNETIC PROPERTIES; MASS SPECTROMETERS; METALS; MEV RANGE; PELLETRON ACCELERATORS; POLYMERS; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTORS
- Descriptors DEC
- ACCELERATORS; CHARGED PARTICLES; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTROSTATIC ACCELERATORS; ELEMENTS; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; IONS; MEASURING INSTRUMENTS; MICROSCOPY; PHYSICAL PROPERTIES; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.