Published August 28, 1998
| Version v1
Journal article
Medical applications of amorphous silicon detectors
- 1. Seccion de Electronica del Estado Solido, Depto. de Ingenieria Electrica, CINVESTAV-IPN, A.P. 14 740, Mexico D.F. (Mexico)
- 2. Centro de Estudio Aplicados al Desarrollo Nuclear, P.O. Box 6122, La Habana (Cuba)
Description
During the last years, much interest has been dedicated to the use of PIN silicon amorphous diodes as particle and radiation detectors for medical applications. This work presents a review of the work done in the last years, including results obtained by the authors, regarding the characterization of amorphous PIN diodes fabricated on thick i-layers, deposited by PECVD (Plasma Enhanced Chemical Vapor Deposition), with a deposition rate of 2.5 μm/hr from pure SiH4 at 200 deg. C, 20 sccm, 43 Pa, RF (Radio Frequency) power of 50 mW/cm2 and from a gas mixture of 10%SiH4 in H2 with deposition rates up to 0.9 μm/hr at a deposition temperature of 300 deg. C, 67 Pa, RF power of 150 mW/cm2 and flow rates of 100 sccm
Additional details
Identifiers
- DOI
- 10.1063/1.56381;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 440
- Journal Issue
- 1
- Journal Page Range
- p. 179-186
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 2. Mexican symposium on medical physics
- Dates
- 26-28 Feb 1998
- Place
- Coyoacan (Mexico)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40069220
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; CHEMICAL VAPOR DEPOSITION; HYDROGEN; LAYERS; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR MATERIALS; SI SEMICONDUCTOR DETECTORS; SILANES
- Descriptors DEC
- CHEMICAL COATING; DEPOSITION; ELEMENTS; HYDRIDES; HYDROGEN COMPOUNDS; MATERIALS; MEASURING INSTRUMENTS; NONMETALS; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SILICON COMPOUNDS; SURFACE COATING
Optional Information
- Notes
- (c) 1998 American Institute of Physics.