Published April 2011 | Version v1
Journal article

Laser annealing of thin film electroluminescent devices deposited at a high rate using high target utilization sputtering

  • 1. Plasma Quest Limited, Unit 1B Rose Estate, Osborn Way, Hook, Hampshire, RG27 9UT (United Kingdom)
  • 2. Nottingham Trent University, School of Science and Technology, Clifton Lane, Nottingham, NG11 8NS (United Kingdom)

Description

This paper presents the photoluminescent (PL) and electroluminescent (EL) characteristics of ZnS:Mn deposited at room temperature using high target utilization sputtering (HiTUS). Significant improvements in PL intensity are seen when ZnS:Mn is deposited using HiTUS instead of conventional RF magnetron sputtering. When incorporated as part of a complete EL device with yttrium oxide forming the dielectric layers and indium tin oxide used as the top contact electrode, localized laser annealing of the ZnS:Mn phosphor layer is shown to provide enhancement of the EL characteristics

Availability note (English)

Available from http://dx.doi.org/10.1088/0268-1242/26/4/045016

Additional details

Identifiers

DOI
10.1088/0268-1242/26/4/045016;
PII
S0268-1242(11)62072-X;

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
26
Journal Issue
4
Journal Page Range
[7 p.]
ISSN
0268-1242
CODEN
SSTEET