Published December 15, 2008
| Version v1
Journal article
Charge trapping effects in photovoltage measurements of (Ga,Mn)As
Creators
- 1. Institut de Physique des Nanostructures, Ecole Polytechnique Federale de Lausanne, CH-1015 Lausanne-EPFL (Switzerland)
- 2. Center for Interdisciplinary Research, Tohoku University, Sendai, 980-5878 (Japan)
Description
We report charge trapping effects in a ferromagnetic (Ga,Mn)As thin film observed during measurements of the photovoltage under inhomogeneous illumination conditions. Using a laser diode as the excitation source, the temperature-dependent response has been observed, with open-circuit voltages as high as -1.4 V. The unexpectedly large and sharp temperature-dependent responses are explained in terms of the excitation of photo-generated charges and their trapping in localised states, or separation of the charges across the film/substrate interface. The sharp features found in the signals suggest their possible use for studying localised trapping states in semiconductors using inhomogeneous illumination
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2008.09.018Additional details
Identifiers
- DOI
- 10.1016/j.physb.2008.09.018;
- PII
- S0921-4526(08)00411-0;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 403
- Journal Issue
- 23-24
- Journal Page Range
- p. 4288-4291
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40058842
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DEFECTS; ELECTRIC POTENTIAL; EXCITATION; ILLUMINANCE; INTERFACES; LASER RADIATION; MAGNETIC SEMICONDUCTORS; SUBSTRATES; TEMPERATURE DEPENDENCE; THIN FILMS; TRAPPING
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ENERGY-LEVEL TRANSITIONS; FILMS; MATERIALS; RADIATIONS; SEMICONDUCTOR MATERIALS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.