Published January 2019 | Version v1
Journal article

The effect of the deposition rate on microstructural and opto-electronic properties of β-Sn layers

  • 1. Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Torun, Grudziadzka 5, 87-100 Torun (Poland)
  • 2. Institute of Mathematics and Physics, UTP University of Science and Technology, Kaliskiego 7, 85-796 Bydgoszcz (Poland)
  • 3. Faculty of Chemistry, Nicolaus Copernicus University in Torun, Gagarina 7, 87-100 Torun (Poland)

Description

Highlights: • The 30 nm layer of β-Sn were formed using thermal evaporation. • Microstructure of Sn films strongly depend on the deposition rate. • The Sn films exhibit strong texture. • The optical resistivity of Sn films depends of the deposition rate. -- Abstract: Microstructural and opto-electronic properties of thin films strongly depend on the deposition conditions (e.g. temperature, deposition rate). The 30 nm tin (Sn) layers were prepared using the physical vapor deposition technique. The tin layers were deposited on the Al2O3 - coated Si substrates at five different deposition rates in the range from 0.05 Å/s up to 5.00 Å/s. The influence of the deposition rate on the microstructure of the surface was investigated using atomic force microscope and scanning electron microscope. Changes in the microstructure of the Sn layers cause variations in its opto-electronic properties. These features were examined using spectroscopic ellipsometry measurements.

Additional details

Identifiers

DOI
10.1016/j.tsf.2018.12.009;
PII
S0040609018308095;

Publishing Information

Journal Title
Thin Solid Films (Print)
Journal Volume
670
Journal Page Range
p. 86-92
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2018 Elsevier B.V. All rights reserved.