The effect of the deposition rate on microstructural and opto-electronic properties of β-Sn layers
- 1. Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Torun, Grudziadzka 5, 87-100 Torun (Poland)
- 2. Institute of Mathematics and Physics, UTP University of Science and Technology, Kaliskiego 7, 85-796 Bydgoszcz (Poland)
- 3. Faculty of Chemistry, Nicolaus Copernicus University in Torun, Gagarina 7, 87-100 Torun (Poland)
Description
Highlights: • The 30 nm layer of β-Sn were formed using thermal evaporation. • Microstructure of Sn films strongly depend on the deposition rate. • The Sn films exhibit strong texture. • The optical resistivity of Sn films depends of the deposition rate. -- Abstract: Microstructural and opto-electronic properties of thin films strongly depend on the deposition conditions (e.g. temperature, deposition rate). The 30 nm tin (Sn) layers were prepared using the physical vapor deposition technique. The tin layers were deposited on the Al2O3 - coated Si substrates at five different deposition rates in the range from 0.05 Å/s up to 5.00 Å/s. The influence of the deposition rate on the microstructure of the surface was investigated using atomic force microscope and scanning electron microscope. Changes in the microstructure of the Sn layers cause variations in its opto-electronic properties. These features were examined using spectroscopic ellipsometry measurements.
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2018.12.009;
- PII
- S0040609018308095;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 670
- Journal Page Range
- p. 86-92
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55041248
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; ATOMIC FORCE MICROSCOPY; DEPOSITS; ELLIPSOMETRY; EVAPORATION; LAYERS; MICROSCOPES; MICROSTRUCTURE; OPTICAL PROPERTIES; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; THIN FILMS; TIN; TOPOGRAPHY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; DEPOSITION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; MEASURING METHODS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.