A New X-ray Scattering Technique for the Analysis of the Low-Z Materials

X-ray scattering technique has been using as a quick analytical tool for the analysis of composition of materials. It has the advantages of non-destruction, rapid analysis, and good accuracy. So many researchers have been studying about analytical methods and applications using X-ray spectrometry. In the X-ray spectrometry, Compton scattering occurred by the low-Z elements like hydrogen, carbon or oxygen have a strong influence on the matrix effects and therefore Compton scattered X-ray are used for matrix correction in determination of several physical quantities such as electron momentum distributions in atoms, molecules and solids, and thickness of material. The aim of this work is to develop a new analytical technique using Compton scattered X-ray peak under various experimental conditions. In this study, X-ray scattering technique is introduced as an alternative method for the determination of thickness of polymer film and water content in a sample because the intensity of Compton scattered characteristic X-ray peak is proportional to amount of the low-Z materials such as organic polymer and water