Published 1989 | Version v1
Report Metadata-only

Infrared reflection spectroscopy--part of an integrated approach to MIIT sample analysis

Creators

  • 1. Florida Univ., Gainesville, FL (USA). Dept. of Materials Science and Engineering
  • 2. Savannah River Lab. Aiken, SC (USA)

Description

This paper documents the use of Fourier Transform Infrared Reflection Spectroscopy (FTIRRS) in conjunction with the Materials Interface Interaction Testing program (MIIT). FTIRRS accomplishes two objectives within the MIIT effort. It serves as a preburial quality assurance tool, allowing determination of uniformity of composition and surface finish within a given group of samples. In addition, FTIRRS is being used along with other surface sensitive techniques to assess glass leaching performance. The use of FTIRRS in both capacities is described, and selected pre- and post- burial data are presented

Part of:
Testing of high-level waste forms under repository conditions

Additional details

Publishing Information

Imprint Title
Testing of high-level waste forms under repository conditions
Imprint Pagination
302 p.
Journal Page Range
p. 140-151.
Report number
EUR--12017

Conference

Title
Workshop jointly organized by CEC, US DOE and CEA.
Dates
17-21 Oct 1988.
Place
Cadarache (France).

INIS

Country of Publication
European Commission (EC), Brussels (Belgium)
Country of Input or Organization
European Commission (EC), Brussels (Belgium)
INIS RN
22012846
Subject category
S12: MANAGEMENT OF RADIOACTIVE WASTES, AND NON-RADIOACTIVE WASTES FROM NUCLEAR FACILITIES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHEMICAL COMPOSITION; GLASS; HIGH-LEVEL RADIOACTIVE WASTES; INFRARED SPECTRA; INFRARED SPECTROMETERS; LEACHING; RADIOACTIVE WASTE DISPOSAL; SURFACE PROPERTIES; WASTE FORMS
Descriptors DEC
DISSOLUTION; MANAGEMENT; MATERIALS; MEASURING INSTRUMENTS; RADIOACTIVE MATERIALS; RADIOACTIVE WASTES; SEPARATION PROCESSES; SPECTRA; SPECTROMETERS; WASTE DISPOSAL; WASTE MANAGEMENT; WASTES

Optional Information