Published August 2007 | Version v1
Journal article Metadata-only

An energy dispersive micro X-ray diffractometer based on a combined system of polycapillary optics

Creators

  • 1. Beijing Radiation Center, Beijing 100875 (China)
  • 2. Institute of Low Energy Nuclear Physics, Beijing Normal University, Beijing 100875 (China)
  • 3. Key Laboratory of Beam Technology and Materials Modification of Ministry of Education, Beijing Normal University, Beijing 100875 (China)
  • 4. Key Laboratory of Beam Technology and Materials Modification of Ministry of Education, Beijing Normal University, Beijing 100875 (China) and Institute of Low Energy Nuclear Physics, Beijing Normal University, Beijing 100875 (China) and Beijing Radiation Center, Beijing 100875 (China)

Description

An energy dispersive micro X-ray diffractometer based on a combined system of two polycapillary X-ray lenses is designed. The polycapillary X-ray lens in the excitation channel is either a polycapillary parallel X-ray lens (PPXRL) or a slightly focusing polycapillary X-ray lens (SFPXRL). The polycapillary X-ray lens in the detection channel is a PPXRL. At 6.4 keV and 2θ = 141.5 deg., the total resolution of the diffractometer based on a SFPXRL in the excitation channel and a PPXRL in the detection channel in Δd/d is 4.8%

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.05.012;
PII
S0168-583X(07)01127-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
262
Journal Issue
1
Journal Page Range
p. 153-156
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39025156
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DETECTION; FOCUSING; KEV RANGE; LENSES; OPTICS; RESOLUTION; X RADIATION; X-RAY DIFFRACTOMETERS
Descriptors DEC
DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.