Published 1983 | Version v1
Miscellaneous

Ion beam thinning of a zirconium alloy for TEM

  • 1. Chile Univ., Santiago. Dept. de Fisica
  • 2. Windsor Univ., Ontario (Canada). Dept. of Engineering Materials

Description

no abstract available

Part of:
Proceedings

Additional details

Publishing Information

ISBN
0-920622-11-9
Imprint Title
Proceedings
Imprint Pagination
81 p.
Journal Page Range
p. 56-57.
Report number
INIS-mf--9646

Conference

Title
Microscopical Society of Canada 10. annual meeting.
Dates
17-19 May 1983.
Place
Chalk River, Ontario (Canada).

INIS

Country of Publication
Canada
Country of Input or Organization
Canada
INIS RN
16026454
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
ION BEAMS; SAMPLE PREPARATION; THICKNESS; TRANSMISSION ELECTRON MICROSCO; ZIRCONIUM BASE ALLOYS; ZIRCONIUM OXIDES
Descriptors DEC
ALLOYS; BEAMS; CHALCOGENIDES; DIMENSIONS; ELECTRON MICROSCOPY; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM ALLOYS; ZIRCONIUM COMPOUNDS

Optional Information

Notes
Summary.