Published August 2003 | Version v1
Journal article

Computer simulation of Lorentz electron micrographs of thin magnetic particles

Description

Lorentz electron microscopy is a powerful tool for high-resolution studies of magnetic structures, not only in continuous thin films, but also in spatially limited, i.e. individual particles. In addition to the experimental studies of magnetic particulate media it is interesting to simulate images in order to compare them with experimental results, as it is practiced in high-resolution electron microscopy. This paper introduces a software package which simulates the Lorentz microscopical image of magnetic structures in thin particles. While other simulation programs deal with infinite magnetic films with homogeneous thickness, the major difference in our calculation is that we take into account the finite dimensions of the particle for specimens of various sizes and shapes. That means the phase shift due to the inner potential depending on the geometrical shape of a magnetic particle is added to the phase shift depending on its magnetic microstructure. The following article presents the computation methods and its results and compares it with experimental findings

Additional details

Identifiers

DOI
10.1016/S0304-3991;
PII
S0304399103000081;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
96
Journal Issue
2
Journal Page Range
p. 201-206
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039593
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
COMPUTER CODES; COMPUTERIZED SIMULATION; ELECTRON MICROSCOPY; ELECTRONS; IMAGES; MICROSTRUCTURE; NANOSTRUCTURES; PARTICLES; PHASE SHIFT; SHAPE; SPATIAL RESOLUTION; THICKNESS; THIN FILMS
Descriptors DEC
DIMENSIONS; ELEMENTARY PARTICLES; FERMIONS; FILMS; LEPTONS; MICROSCOPY; RESOLUTION; SIMULATION

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.