The p-type doping of vacuum deposited ZnTe thin films with bismuth by a new technique of using nano-spheres
- 1. Department of Physics, Manipal Institute of Technology, Manipal 576104, Karnataka (India)
- 2. Thin Film Laboratory, Department of Physics, National Institute of Technology Karnataka Surathkal Srinivasnagar, Mangalore 575025, Karnataka (India)
Description
The present paper reports the successful doping of vacuum evaporated zinc telluride (ZnTe) thin films with bismuth by a new technique of using nano-spheres. The discontinuous films of bismuth (the dopant material), containing bismuth in the form of nano-spheres, were prepared by vacuum evaporation and the ZnTe films were then deposited on top of them. The scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques were used to ascertain the formation of discontinuous bismuth films and the proper diffusion of bismuth in ZnTe films, respectively. After doping, the carrier concentration of the ZnTe films was found to increase by an order of the magnitude. The electrical conductivity also improved significantly. The photoconductivity and photo-response properties of the doped films were also analysed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.mseb.2010.07.012Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2010.07.012;
- PII
- S0921-5107(10)00474-5;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 175
- Journal Issue
- 2
- Journal Page Range
- p. 185-188
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43030513
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BISMUTH; DOPED MATERIALS; PHOTOCONDUCTIVITY; SCANNING ELECTRON MICROSCOPY; SPHERES; THIN FILMS; VACUUM EVAPORATION; X-RAY DIFFRACTION; ZINC; ZINC TELLURIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; EVAPORATION; FILMS; MATERIALS; METALS; MICROSCOPY; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.