Direct inversion from partial-boundary data in electrical impedance tomography
- 1. Department of Mathematics and Statistics, University of Helsinki, Helsinki (Finland)
- 2. Department of Mathematics, Politecnico di Milano, Milano (Italy)
Description
In electrical impedance tomography (EIT) one wants to image the conductivity distribution of a body from current and voltage measurements carried out on its boundary. In this paper we consider the underlying mathematical model, the inverse conductivity problem, in two dimensions and under the realistic assumption that only a part of the boundary is accessible to measurements. In this framework our data are modeled as a partial Neumann-to-Dirichlet map (ND map). We compare this data to the full-boundary ND map and prove that the error depends linearly on the size of the missing part of the boundary. The same linear dependence is further proved for the difference of the reconstructed conductivities—from partial and full boundary data. The reconstruction is based on a truncated and linearized D-bar method. Auxiliary results include an extrapolation method to estimate the full-boundary data from the measured one, an approximation of the complex geometrical optics solutions computed directly from the ND map as well as an approximate scattering transform for reconstructing the conductivity. Numerical verification of the convergence results and reconstructions are presented for simulated test cases. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6420/33/2/025009Additional details
Identifiers
Publishing Information
- Journal Title
- Inverse Problems
- Journal Volume
- 33
- Journal Issue
- 2
- Journal Page Range
- [26 p.]
- ISSN
- 0266-5611
- CODEN
- INVPET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49037562
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S97: MATHEMATICAL METHODS AND COMPUTING;
- Descriptors DEI
- APPROXIMATIONS; CONVERGENCE; DATA VISUALIZATION; DIRICHLET PROBLEM; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; ERRORS; EXTRAPOLATION; MATHEMATICAL MODELS; OPTICS; SCATTERING; SIMULATION; TOMOGRAPHY; VERIFICATION
- Descriptors DEC
- BOUNDARY-VALUE PROBLEMS; CALCULATION METHODS; CURRENTS; DATA ANALYSIS; DATA PROCESSING; DIAGNOSTIC TECHNIQUES; ELECTRICAL PROPERTIES; IMPEDANCE; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION; PHYSICAL PROPERTIES; PROCESSING