Published 1995
| Version v1
Miscellaneous
Lepidolites of the pegmatites from Zambetzia, Mozambique: geochemistry study by X-ray fluorescence with synchrotron radiation
Creators
- 1. IICT, Lisbon (Portugal). Centro de Cristalografia e Mineralogia
- 2. Universidade Eduardo Mondlane, Maputo (Mozambique). Dept. de Quimica
- 3. Instituto Superior Tecnico, Lisbon (Portugal). Lab. de Mineralogia e Petrologia
- 4. Universidade de Lisboa (Portugal). Centro de Fisica Atomica
- 5. Paris-11 Univ., 91 - Orsay (France). Lab. pour l'Utilisation du Rayonnement Electromagnetique (LURE)
Description
Short communication. 4 refs
Availability note (English)
Available from the Library of the Brazilian Nuclear Energy Commission, Rio de Janeiro (Compact Disk 1).Additional details
Additional titles
- Original title (Portuguese)
- Lepidolites dos pegmatites da Zambetzia, Mocambique: estudo geoquimico por FRX com radiacao de sincrotrao
Publishing Information
- Imprint Pagination
- 1 p.
Conference
- Title
- 5. Brazilian congress on geochemistry; 3. congress on geochemistry of the Portuguese language countries.
- Original Conference Title
- 5. congresso brasileiro de geoquimica
- Dates
- 23-27 Oct 1995.
- Place
- Niteroi, RJ (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 28046632
- Subject category
- S58: GEOSCIENCES; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- CESIUM; FLUORESCENCE SPECTROSCOPY; GADOLINIUM; GALLIUM; GEOCHEMISTRY; LANTHANUM; MOZAMBIQUE; NEODYMIUM; PEGMATITES; SAMARIUM; SYNCHROTRON RADIATION; TANTALUM; TRACE AMOUNTS; TUNGSTEN; X-RAY FLUORESCENCE ANALYSIS; ZINC
- Descriptors DEC
- AFRICA; ALKALI METALS; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; DEVELOPING COUNTRIES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION SPECTROSCOPY; IGNEOUS ROCKS; METALS; NONDESTRUCTIVE ANALYSIS; PLUTONIC ROCKS; RADIATIONS; RARE EARTHS; ROCKS; SPECTROSCOPY; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS