Published May 21, 2011 | Version v1
Journal article

SLIM5 beam test results for thin striplet detector and fast readout beam telescope

  • 1. Universita degli Studi di Trieste and INFN-Trieste (Italy)
  • 2. Universita degli Studi di Bologna and INFN-Bologna (Italy)
  • 3. Universita degli Studi di Pisa and INFN-Pisa (Italy)

Description

In September 2008 the SLIM5 collaboration submitted a low material budget silicon demonstrator to test with 12 GeV/c protons, at the PS-T9 test-beam at CERN. Two different detectors were placed as DUTs inside a high-resolution and fast-readout beam telescope. The first DUT was a high resistivity double sided silicon detector, with short strips ('striplets') and with reduced thickness, at 450 angle to the detector's edge, readout by the data-driven FSSR2 chip. The other one was a 4k-Pixel Matrix of Deep N Well MAPS, developed in a 130 nm CMOS Technology, providing digital sparsified readout. In the following, I present the striplets and also the beam telescope characteristics, with some details about the frontend readout (based on the FSSR2 chip) and some preliminary results of the data-analysis.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.09.039

Additional details

Identifiers

DOI
10.1016/j.nima.2009.09.039;
PII
S0168-9002(09)01781-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
617
Journal Issue
1-3
Journal Page Range
p. 601-604
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
11. Pisa meeting on advanced detectors
Dates
24-30 May 2009
Place
La Biodola, Elba (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42009493
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAMS; CERN; CHARGED PARTICLES; DATA ANALYSIS; GEV RANGE; PROTONS; READOUT SYSTEMS; RESOLUTION; SI SEMICONDUCTOR DETECTORS; SILICON; TELESCOPES; THICKNESS
Descriptors DEC
BARYONS; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; HADRONS; INTERNATIONAL ORGANIZATIONS; MEASURING INSTRUMENTS; NUCLEONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.