SLIM5 beam test results for thin striplet detector and fast readout beam telescope
Creators
- 1. Universita degli Studi di Trieste and INFN-Trieste (Italy)
- 2. Universita degli Studi di Bologna and INFN-Bologna (Italy)
- 3. Universita degli Studi di Pisa and INFN-Pisa (Italy)
Description
In September 2008 the SLIM5 collaboration submitted a low material budget silicon demonstrator to test with 12 GeV/c protons, at the PS-T9 test-beam at CERN. Two different detectors were placed as DUTs inside a high-resolution and fast-readout beam telescope. The first DUT was a high resistivity double sided silicon detector, with short strips ('striplets') and with reduced thickness, at 450 angle to the detector's edge, readout by the data-driven FSSR2 chip. The other one was a 4k-Pixel Matrix of Deep N Well MAPS, developed in a 130 nm CMOS Technology, providing digital sparsified readout. In the following, I present the striplets and also the beam telescope characteristics, with some details about the frontend readout (based on the FSSR2 chip) and some preliminary results of the data-analysis.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2009.09.039Additional details
Identifiers
- DOI
- 10.1016/j.nima.2009.09.039;
- PII
- S0168-9002(09)01781-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 617
- Journal Issue
- 1-3
- Journal Page Range
- p. 601-604
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 11. Pisa meeting on advanced detectors
- Dates
- 24-30 May 2009
- Place
- La Biodola, Elba (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42009493
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; CERN; CHARGED PARTICLES; DATA ANALYSIS; GEV RANGE; PROTONS; READOUT SYSTEMS; RESOLUTION; SI SEMICONDUCTOR DETECTORS; SILICON; TELESCOPES; THICKNESS
- Descriptors DEC
- BARYONS; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; HADRONS; INTERNATIONAL ORGANIZATIONS; MEASURING INSTRUMENTS; NUCLEONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.