Published October 2009 | Version v1
Journal article

Anisotropic electric-field-enhanced electron emission from deep-level defects in GaAs

  • 1. Institute of Physics, Polish Academy of Sciences, Al. Lotnikow 32/46, 02-668 Warsaw (Poland)

Description

Strongly anisotropic electric-field enhancements of the thermal emission rates of electrons from the EL3 and EL5 deep-level defects in n-type GaAs crystal have been revealed with the double-correlation deep-level transient spectroscopy. The results, analysed by taking into account both the Poole–Frenkel and phonon-assisted tunnel effects, evidence a strong coupling of the defects to the lattice vibronic modes. The defect potential anisotropy of EL3 is consistent with the defect identification as an off-centre substitutional oxygen on the arsenic site. The revealed surprising break-down of the emission-rate enhancement, for the electric field applied along the (1 0 0) crystallographic direction, is interpreted as resulting from a possible reorientation of the EL3 defect, owing to a jump of the oxygen ion into a neighbouring lattice site, driven by a strong electric field. On the other hand, a close pair divacancy complex is suggested to be responsible for the EL5 defect

Availability note (English)

Available from http://dx.doi.org/10.1088/0268-1242/24/10/105021

Additional details

Identifiers

DOI
10.1088/0268-1242/24/10/105021;
PII
S0268-1242(09)11169-0;

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
24
Journal Issue
10
Journal Page Range
[6 p.]
ISSN
0268-1242
CODEN
SSTEET