Published December 31, 2003 | Version v1
Journal article

Nature of visible luminescence of co-sputtered Si-SiOx systems

Description

Photoluminescence (PL) spectra and Raman scattering spectra of Si-SiOx systems, prepared by radio frequency magnetron sputtering method and thermal annealed at 1150 deg. C for creation of Si nano-crystallites, were investigated as a function of Si content and Si nano-crystallite sizes. It was shown that the PL spectrum of such systems consists of several bands with peak positions at 1.32-1.34, 1.42-1.58, 1.77, 2.05 and 2.30 eV. The dependencies of these PL band parameters on concentration and size of Si nano-crystallites in the Si-SiOx system have been investigated and analyzed. The nature of radiative optical transitions for all PL bands is discussed

Additional details

Identifiers

DOI
10.1016/j.physb.2003.09.235;
PII
S092145260300869X;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
340-342
Journal Issue
3-4
Journal Page Range
p. 1119-1123
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
22. international conference on defects in semiconductors
Dates
28 Jul - 1 Aug 2003
Place
Aarhus (Denmark)

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.