Published December 31, 2003
| Version v1
Journal article
Nature of visible luminescence of co-sputtered Si-SiOx systems
Description
Photoluminescence (PL) spectra and Raman scattering spectra of Si-SiOx systems, prepared by radio frequency magnetron sputtering method and thermal annealed at 1150 deg. C for creation of Si nano-crystallites, were investigated as a function of Si content and Si nano-crystallite sizes. It was shown that the PL spectrum of such systems consists of several bands with peak positions at 1.32-1.34, 1.42-1.58, 1.77, 2.05 and 2.30 eV. The dependencies of these PL band parameters on concentration and size of Si nano-crystallites in the Si-SiOx system have been investigated and analyzed. The nature of radiative optical transitions for all PL bands is discussed
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2003.09.235;
- PII
- S092145260300869X;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 340-342
- Journal Issue
- 3-4
- Journal Page Range
- p. 1119-1123
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 22. international conference on defects in semiconductors
- Dates
- 28 Jul - 1 Aug 2003
- Place
- Aarhus (Denmark)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37000745
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; ANNEALING; CONCENTRATION RATIO; EV RANGE; MAGNETRONS; PHOTOLUMINESCENCE; QUANTUM DOTS; RADIOWAVE RADIATION; RAMAN EFFECT; SILICON; SILICON OXIDES; SPUTTERING
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EMISSION; ENERGY RANGE; EQUIPMENT; HEAT TREATMENTS; LUMINESCENCE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RADIATIONS; SEMIMETALS; SILICON COMPOUNDS; SPECTRA
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.