All-optical NOR and XNOR logic gates at 2 Tb/s based on two-photon absorption in quantum-dot semiconductor optical amplifiers
Creators
- 1. University of Fayoum. Department of Physics, Faculty of Science (Egypt)
- 2. Chinese Academy of Sciences. The Guo China-US Photonics Laboratory, Changchun Institute of Optics, Fine Mechanics, and Physics (China)
- 3. University of Rochester. The Institute of Optics (United States)
Description
Two-photon absorption (TPA) is a nonlinear absorption process in semiconductors, creating a fast phase change in a low-intensity probe beam. Placing quantum-dots (QDs), on the other hand, in the active region of semiconductor optical amplifiers (SOAs) results in SOAs shorter carrier recovery time and lower gain saturation. Thus, in this article, the physical advantages of both TPA and QDs have been combined to numerically investigate the performance of all-optical NOT-OR (NOR) and exclusive-NOR (XNOR) logic gates, incorporating in Mach–Zehnder interferometers at a data rate of 2 Tb/s. The output quality factor (QF) of the considered Boolean functions against the key operational parameters is assessed and examined, including the impact of amplified spontaneous emission in order to obtain more realistic results. The overall QF in the presence of TPA is always higher than that without TPA.
Additional details
Identifiers
Publishing Information
- Journal Title
- Optical and Quantum Electronics
- Journal Volume
- 52
- Journal Issue
- 1
- Journal Page Range
- vp.
- ISSN
- 0306-8919
- CODEN
- OQELDI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55104687
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ABSORPTION; AMPLIFIERS; CARRIERS; EMISSION; GAIN; INTERFEROMETERS; INTERFEROMETRY; MACH-ZEHNDER INTERFEROMETER; NONLINEAR PROBLEMS; PERFORMANCE; PHASE SHIFT; PHOTON BEAMS; PHOTONS; QUANTUM DOTS; SATURATION; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- AMPLIFICATION; BEAMS; BOSONS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; INTERFEROMETERS; MASSLESS PARTICLES; MATERIALS; MEASURING INSTRUMENTS; NANOSTRUCTURES; SORPTION
Optional Information
- Copyright
- Copyright (c) 2019 © Springer Science+Business Media, LLC, part of Springer Nature 2019