Published December 5, 2005 | Version v1
Journal article

TEM characterization of the precipitation reaction in Ti-48Al-10Nb alloy

  • 1. National Laboratory of Solid State Microstructure, Nanjing University, Nanjing 210093 (China)

Description

A detailed transmission electron microscopy (TEM) study has been made of the morphology and the crystallographic characteristics of precipitation of the γ1-Ti4Nb3Al9 in the γ-TiAl matrix in Ti-Al-Nb system. It is revealed that the γ1-Ti4Nb3Al9 precipitates, which are formed by a normal quench at 1473K and ageing treatment at 1073K, take needle-like morphology with a growing axis parallel to [001] direction of the matrix. The needle-like precipitates act as barrier grid to inhibit dislocation moving on the slipping plane {111} of the γ-TiAl matrix, which helps to improve the strength of the alloy. Selected electron microscopy analysis shows that the orientation relationship between the γ1 phase and the γ-TiAl matrix is [001]γ1//[001]γ (100)γ1//(110)γ and (010)γ1//(1-bar 10)γ. The needle-like morphology of the precipitated phase is discussed with the coherency stress across the precipitate/matrix interface that is considered to be the main factor controlling the precipitate morphology

Additional details

Identifiers

DOI
10.1016/j.msea.2005.09.039;
PII
S0921-5093(05)01134-2;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
412
Journal Issue
1-2
Journal Page Range
p. 328-335
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
International conference on recent advances in composite materials
Dates
17-19 Dec 2004
Place
Varanasi (India)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38076276
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AGING; CRYSTALLOGRAPHY; DISLOCATIONS; INTERMETALLIC COMPOUNDS; MATRICES; MORPHOLOGY; PRECIPITATION; STRESSES; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; LINE DEFECTS; MICROSCOPY; SEPARATION PROCESSES

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.