TEM characterization of the precipitation reaction in Ti-48Al-10Nb alloy
- 1. National Laboratory of Solid State Microstructure, Nanjing University, Nanjing 210093 (China)
Description
A detailed transmission electron microscopy (TEM) study has been made of the morphology and the crystallographic characteristics of precipitation of the γ1-Ti4Nb3Al9 in the γ-TiAl matrix in Ti-Al-Nb system. It is revealed that the γ1-Ti4Nb3Al9 precipitates, which are formed by a normal quench at 1473K and ageing treatment at 1073K, take needle-like morphology with a growing axis parallel to [001] direction of the matrix. The needle-like precipitates act as barrier grid to inhibit dislocation moving on the slipping plane {111} of the γ-TiAl matrix, which helps to improve the strength of the alloy. Selected electron microscopy analysis shows that the orientation relationship between the γ1 phase and the γ-TiAl matrix is [001]γ1//[001]γ (100)γ1//(110)γ and (010)γ1//(1-bar 10)γ. The needle-like morphology of the precipitated phase is discussed with the coherency stress across the precipitate/matrix interface that is considered to be the main factor controlling the precipitate morphology
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2005.09.039;
- PII
- S0921-5093(05)01134-2;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 412
- Journal Issue
- 1-2
- Journal Page Range
- p. 328-335
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- International conference on recent advances in composite materials
- Dates
- 17-19 Dec 2004
- Place
- Varanasi (India)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38076276
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AGING; CRYSTALLOGRAPHY; DISLOCATIONS; INTERMETALLIC COMPOUNDS; MATRICES; MORPHOLOGY; PRECIPITATION; STRESSES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; LINE DEFECTS; MICROSCOPY; SEPARATION PROCESSES
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.